|
Description
|
Specification |
| Machine Model: | 2244i |
| Lens Type (Resolution) | 0.65 um |
| Lens NA | 0.365 |
| Lens Matching Ref | 200 nm |
| Aperture Sizes | 25.2 x 44 mm |
| Field Size | 25.2 x 44 mm |
| Crossmask Size | 150 um |
| Wafer Size | 6 inch |
| Reticle Size | 5x5 inch |
| Chamber Type, Power and Frequency Stainless UD 60 | Please see the attached picture |
| Specs Test Results | |
| Description | Specification |
| Lens Distortion | < 200 nm |
| DOF 0.65 um | ≧ 2 µm |
| CD Uniformity | £ 10 % |
| Wafer plane irradiance 1000W (i-line) | > 600 mW/cm2 |
| (Depend on machine condition) | |
| Exposure uniformity | £ 2 % |
| Throughput @ 100mJ/cm^2, 5 point EGA, 90% wafer coverage | > 80 WPH |
| Day 1 Day 2 | |
| EGA (WAS) alignment X | 3 sigma < 150 nm |
| EGA (WAS) alignment Y | 3 sigma < 150 nm |
| EGA (MVS) alignment X | No assigned |
| EGA (MVS) alignment Y | No assigned |
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